代表性论文专著
著作
Feng X#*, Du Z, Yang J; Advances in Optical Surface Texture Metrology(Non-scanning techniques), IOP Publishing, 8千字, 2020.
期刊论文
2019
[1] Feng X#*, Senin N, Su R, Ramasamy S, Leach R 2019 Optical measurement of surface topographies with transparent coatings Opt. Laser. Eng. 121 261-270
[2] Liu M, Cheung C F, Feng X, Wang C 2019 Diamond machining of freeform-patterned surfaces on precision rollers Int. J. Adv. Manuf. Technol. 103 4423-4431
[3] Maculotti G, Feng X, Su R, Galetto M, Leach R K 2019 Residual flatness and scale calibration for a point autofocus surface topography measuring instrument Meas. Sci. Technol. 30 075005
[4] Liu M Y, Cheung C F, Feng X, Ho L T, Yang S M 2019 Gaussian process machine learning-based surface extrapolation method for improvement of the edge effect in surface filtering Measurement 137 214-224
2018
[1] Feng X#, Su R#*, Happonen T, Liu J, Leach R K 2018 Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing Opt. Express 26 13927-13937
[2] Maculotti G, Feng X*, Galetto M, Leach R K 2018 Noise evaluation of a point autofocus surface topography measuring instrument Meas. Sci. Technol.29 065008
[3] Cheung C F, Liu M, Leach R K, Feng X, Zhao C 2018 Hierarchical-information-based characterization of multiscale structured surfaces Ann. CIRP 67 539-542
[4] Wu J, Bin D, Feng X, Wen Z, Zhang Y 2018 GA based adaptive singularity-robust path planning of space robot for on-orbit detection Complexity 2018 3702916
[5] Liu M Y, Cheung C F, Feng X, Wan C J, Leach R K 2018 A self-calibration rotational stitching method for precision measurement of revolving surfaces Prec. Eng. 54 60-69
2017
[1] Feng X#, Pascal J, Lawes S* 2017 A microscopy approach for in situ inspection of the μCMM stylus for contamination Meas. Sci. Technol. 28 095010
[2] Feng X#, Kinnell P K, Lawes S* 2017 Development of CO2 snow cleaning for in situ cleaning of μCMM stylus tips Meas. Sci. Technol. 28 015007
[3] Shi S, Lin J, Xu X, Feng X, Piano S 2017 Manufacturing-error-based maintenance for high-precision machine tools Int. J. Adv. Manufac. Technol. 95 205-217
2016
[1] Feng X#, Wong Y S*, Hong G S 2016 Characterization and geometric modeling of single and overlapping craters in micro-EDM Mach. Sci. Technol. 20 79-98
工业杂志论文
[1] Leach R K, Senin N, Feng X, Stavroulakis P, Su R, Syam W P, Widjanarko T 2017 Information-rich metrology: changing the game Commercial Micro Manufacturing 8 33-39
[2] Lawes S, Feng X 2016 In-situ cleaning of μCMM stylus using CO2 snow Commercial Micro
Manufacturing 2 28-31
会议论文
[1] Feng X, Su R, Happonen T, Liu J, Leach RK 2018 All-optical difference engine for in-process defect inspection for roll-to-roll printed electronics 10th ISPEMI, Kunming, China Aug
[2] Echeta I, Feng X, Piano S, Leach R K 2018 Analysis of strut bending defects in additively manufactured lattice structures by X-ray computed tomography dXCT, Nottingham, UK, Jul
[3] Maculotti G, Feng X, Galetto M, Leach R K 2018 Measurement noise calibration, noise bandwidth specification and environment effects in a 3D point autofocusing instrument Proc. 18th Int. euspen Conf., Venice, Italy, Jun 155-156
[4] Feng X, Quagliotti D, Maculotti G, Syam W S, Tosello G, Hansen H N, Galetto M, Leach R K 2017 Measurement noise of a point autofocus surface topography instrument Proc. 16th Met. & Props, Gothenburg, Sweden, Jun 66-67
[5] Feng X, Su R, Liu M, Leach R K 2017 Optical difference engine for defect inspection in highly-parallel manufacturing processes 12th LAMDAMAP Conf., Wotton-under-Edge, UK, Mar 214-217
[6] Feng X, Lacorne C, Fernandes G Q, Lawes S, Kinnell P 2015 Contamination of µCMM stylus tips: on-machine inspection Proc. 16th Int. euspen Conf., Nottingham, UK, Jun 85-86
[7] Feng X, Lawes S, Kinnell P 2015 The development of a snow cleaning system for micro-CMM stylus tips Proc. 15th Int. euspen Conf., Leuven, Belgium, Jun 191-192
[8] Feng X, Lawes S, Kinnell P 2015 Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips Proc. 4M/ICOMM 2015 Conf., Milan, Italy, Mar 506-509
[9] Feng X, Wong Y S, Hong G S 2014 Characterization and modeling of single and overlapping crater shapes in micro-EDM 11th Asia Pac. Conf. Mater. Proc. Auckland, New Zealand, Jul
[10] Feng X, Wong Y S, Hong G S 2012 Modeling of Micro Wire EDM Process and Wire Vibration ICOMM 2012 Evanston, Illinois, USA, Mar