2008.8 - 2014.1 National University of Singapore, Department of Mechanical Engineering, PhD
2004.9 - 2008.7 Shanghai Jiao Tong University, School of Mechanical Engineering, BEng

2018.12 - present Assistant Professor, School of Mechanical Engineering, Shanghai Jiao Tong University
2014.4 - 2018.11 Research Fellow, University of Nottingham

2014.4 - 2018.11 Research Fellow, University of Nottingham

Intelligent Manufacturing (Industry 4.0)
--In-situ metrology and process monitoring for intelligent manufacturing
--Intelligent manufacturing-oriented AI
--Intelligent healing of CNC machine tool accuracy
--On-line defect monitoring for roll-to-roll manufacturing
Precision Metrology
--Micro-CMM stylus cleaning for improving measurement accuracy
--Performance calibration for precision measurement instruments（ISO 10360, VDI/VDE 2634, ISO 25178）
--Surface metrology and surface feature extraction
--Form and dimensional metrology

2019.6 - 2022.5 Shanghai Natural Science Foundation，Study on precision CMM stylus contamination mechanism and its effect on measurement accuracy
2019.6 - 2023.5 The National Key Research and Development Program of China，Big data-driven process monitoring and accuracy control for the intelligent manufacturing of complex parts
2019.1 - 2020.12 SKL of Mechanical System and Vibration project, In-situ metrology assisted machining accuracy healing for 5-axis milling of turbine blades
2018.3 - 2018.11 EU iNet project, ARTEFACT
2017.3 - 2017.8 Industrial project, Measurement performance calibration for a point autofocus instrument
2017.1 - 2018.11 EMPIR 15HLT09, Metrology for additively manufactured medical implants (MetAMMI)
2016.7 - 2018.5 EMPIR 14IND09, Metrology for highly parallel manufacturing (MetHPM)
2016.5 - 2016.12 Industrial project, Measurement and analysis of complex surfaces in state-of-the-art industrial application
2014.4 - 2016.5 EMRP IND59, Multi-sensor metrology for microparts in innovative industrial products (Microparts)

Journal
2019
[1] Feng X#*, Senin N, Su R, Ramasamy S, Leach R 2019 Optical measurement of surface topographies with transparent coatings Opt. Laser. Eng. 121 261-270
[2] Liu M, Cheung C F, Feng X, Wang C 2019 Diamond machining of freeform-patterned surfaces on precision rollers Int. J. Adv. Manuf. Technol. 103 4423-4431
[3] Maculotti G, Feng X, Su R, Galetto M, Leach R K 2019 Residual flatness and scale calibration for a point autofocus surface topography measuring instrument Meas. Sci. Technol. 30 075005
[4] Liu M Y, Cheung C F, Feng X, Ho L T, Yang S M 2019 Gaussian process machine learning-based surface extrapolation method for improvement of the edge effect in surface filtering Measurement 137 214-224

2018
[1] Feng X*, Su R, Happonen T, Liu J, Leach R K 2018 Fast and cost-effective in-process defect inspection for printed electronics based on coherent optical processing Opt. Express 26 13927-13937
[2] Maculotti G, Feng X*, Galetto M, Leach R K 2018 Noise evaluation of a point autofocus surface topography measuring instrument Meas. Sci. Technol.29 065008
[3] Cheung C F, Liu M, Leach R K, Feng X*, Zhao C 2018 Hierarchical-information-based characterization of multiscale structured surfaces Ann. CIRP 67 539-542
[4] Wu J, Bin D, Feng X*, Wen Z, Zhang Y 2018 GA based adaptive singularity-robust path planning of space robot for on-orbit detection Complexity 2018 3702916
[5] Liu M Y, Cheung C F, Feng X*, Wan C J, Leach R K 2018 A self-calibration rotational stitching method for precision measurement of revolving surfaces Prec. Eng. 54 60-69

2017
[1] Feng X*, Pascal J, Lawes S 2017 A microscopy approach for in situ inspection of the μCMM stylus for contamination Meas. Sci. Technol. 28 095010
[2] Feng X*, Kinnell P K, Lawes S 2017 Development of CO2 snow cleaning for in situ cleaning of μCMM stylus tips Meas. Sci. Technol. 28 015007
[3] Shi S, Lin J, Xu X, Feng X*, Piano S 2017 Manufacturing-error-based maintenance for high-precision machine tools Int. J. Adv. Manufac. Technol. 95 205-217

2016
[1] Feng X*, Wong Y S, Hong G S 2016 Characterization and geometric modeling of single and overlapping craters in micro-EDM Mach. Sci. Technol. 20 79-98

Industrial magzine
Leach R K, Senin N, Feng X*, Stavroulakis P, Su R, Syam W P, Widjanarko T 2017 Information-rich metrology: changing the game Commercial Micro Manufacturing 8 33-39

Conference
[1] Feng X, Su R, Happonen T, Liu J, Leach RK 2018 All-optical difference engine for in-process defect inspection for roll-to-roll printed electronics 10th ISPEMI, Kunming, China Aug
[2] Echeta I, Feng X, Piano S, Leach R K 2018 Analysis of strut bending defects in additively manufactured lattice structures by X-ray computed tomography dXCT, Nottingham, UK, Jul
[3] Maculotti G, Feng X, Galetto M, Leach R K 2018 Measurement noise calibration, noise bandwidth specification and environment effects in a 3D point autofocusing instrument Proc. 18th Int. euspen Conf., Venice, Italy, Jun 155-156
[4] Feng X, Quagliotti D, Maculotti G, Syam W S, Tosello G, Hansen H N, Galetto M, Leach R K 2017 Measurement noise of a point autofocus surface topography instrument Proc. 16th Met. & Props, Gothenburg, Sweden, Jun 66-67
[5] Feng X, Su R, Liu M, Leach R K 2017 Optical difference engine for defect inspection in highly-parallel manufacturing processes 12th LAMDAMAP Conf., Wotton-under-Edge, UK, Mar 214-217
[6] Feng X, Lacorne C, Fernandes G Q, Lawes S, Kinnell P 2015 Contamination of µCMM stylus tips: on-machine inspection Proc. 16th Int. euspen Conf., Nottingham, UK, Jun 85-86
[7] Feng X, Lawes S, Kinnell P 2015 The development of a snow cleaning system for micro-CMM stylus tips Proc. 15th Int. euspen Conf., Leuven, Belgium, Jun 191-192
[8] Feng X, Lawes S, Kinnell P 2015 Evaluation of the capabilities and damage risk of cleaning methods for micro-CMM stylus tips Proc. 4M/ICOMM 2015 Conf., Milan, Italy, Mar 506-509
[9] Feng X, Wong Y S, Hong G S 2014 Characterization and modeling of single and overlapping crater shapes in micro-EDM 11th Asia Pac. Conf. Mater. Proc. Auckland, New Zealand, Jul
[10] Feng X, Wong Y S, Hong G S 2012 Modeling of Micro Wire EDM Process and Wire Vibration ICOMM 2012 Evanston, Illinois, USA, Mar

Member of the European Society for Precision Engineering and Nanotechnology (euspen)
Member of the Optical Society of America (OSA)
Member of the China Instrument and Control Society (CIS)
Peer reviewer for Machining Science and Technology
CIOM 2019 committee member & session chair
DXCT 2018 organising committee member